Producer | RM Code | Name | Item | Trust | Updated | |
---|---|---|---|---|---|---|
21 | KRISS | KRISS 207-03-504 | (90 nm thick., 100 mm wafer) Certified reference material for the thickness of a thin film layer of silicon nitride grown on silicon | metrology, thin-film thickness | 20-12-2023 | |
Properties:
thickness of silicon nitride thin film layer 87.91 nm |
Remarks: Intended Use: CRM Certificate: 207-03-504.pdf |
|||||
Producer: (click for contact & purchase details) This material is produced under a valid ISO 17034 accreditation | This material is linked to statutory activities as a national metrology institute (NMI) / a designated institute (DI) |
||||||
Public link to this factsheet: www.comar.bam.de/rm/503467 |
||||||
22 | KRISS | KRISS 207-03-514 | (90 nm thick., 150 mm wafer) Certified reference material for the thickness of a thin film layer of silicon nitride grown on silicon | metrology, thin-film thickness | 20-12-2023 | |
Properties:
thickness of silicon nitride thin film layer 87.91 nm |
Remarks: Intended Use: CRM Certificate: 207-03-514.pdf |
|||||
Producer: (click for contact & purchase details) This material is produced under a valid ISO 17034 accreditation | This material is linked to statutory activities as a national metrology institute (NMI) / a designated institute (DI) |
||||||
Public link to this factsheet: www.comar.bam.de/rm/503473 |
||||||
23 | KRISS | KRISS 207-03-524 | (90 nm thick., 200 mm wafer) Certified reference material for the thickness of a thin film layer of silicon nitride grown on silicon | thin-film thickness | 28-07-2023 | |
Properties:
thickness of silicon nitride thin film layer 87.91 nm |
Remarks: Intended Use: CRM Certificate: 207-03-524.pdf |
|||||
Producer: (click for contact & purchase details) This material is produced under a valid ISO 17034 accreditation | This material is linked to statutory activities as a national metrology institute (NMI) / a designated institute (DI) |
||||||
Public link to this factsheet: www.comar.bam.de/rm/494479 |
||||||
24 | KRISS | KRISS 207-03-534 | (90 nm thick., 300 mm wafer) Certified reference material for the thickness of a thin film layer of silicon nitride grown on silicon | thin-film thickness | 28-07-2023 | |
Properties:
thickness of silicon nitride thin film layer 87.91 nm |
Remarks: Intended Use: CRM Certificate: 207-03-534.pdf |
|||||
Producer: (click for contact & purchase details) This material is produced under a valid ISO 17034 accreditation | This material is linked to statutory activities as a national metrology institute (NMI) / a designated institute (DI) |
||||||
Public link to this factsheet: www.comar.bam.de/rm/494485 |
||||||
25 | KTL | KTL-RM301-02-1 | 0.4 wt% Single Walled Carbon Nano Tube dispersion reference material | Particle characteristics | 31-01-2024 | |
Properties:
viscosity* 250~330 cP solid content* 0.90 ~ 1.20 wt% *indicative |
Remarks: Intended Use: CRM Certificate: KTL-RM301-02-1.pdf |
|||||
Producer: (click for contact & purchase details) This material is produced under a valid ISO 17034 accreditation |
||||||
Public link to this factsheet: www.comar.bam.de/rm/506460 |
||||||
26 | KTL | KTL-RM301-02-2 | 0.8 wt% Single Walled Carbon Nano Tube dispersion reference material | Particle characteristics | 31-01-2024 | |
Properties:
viscosity* 1 300 ~ 1 600 cP solid content* 1.90 ~ 2.20 wt% *indicative |
Remarks: Intended Use: CRM Certificate: KTL-RM301-02-2.pdf |
|||||
Producer: (click for contact & purchase details) This material is produced under a valid ISO 17034 accreditation |
||||||
Public link to this factsheet: www.comar.bam.de/rm/506461 |
||||||
27 | NMIJ | NMIJ CRM 4014-a | 1,1-Dichloroethylene | Pure organic material | 05-09-2023 | |
Properties:
Amount of Substance Fraction 1,1-Dichloroethylene (CAS 75-35-4) : 0.9999 ± 0.0007 (mol/mol) - Indicative Value Mass Fraction* 1,1-Dichloroethylene :* 0.9999 ± 0.0008 (kg/kg) *indicative |
Remarks: Intended Use: CRM Certificate: NMIJ_CRM_4014a_en.pdf |
|||||
Producer: (click for contact & purchase details) This material is produced under a valid ISO 17034 accreditation | This material is linked to statutory activities as a national metrology institute (NMI) / a designated institute (DI) |
||||||
Public link to this factsheet: www.comar.bam.de/rm/322200 |
||||||
28 | NMIJ | NMIJ CRM 4004-a | 1,2-Dichloroethane | Pure organic material | 05-09-2023 | |
Properties:
Amount-of-Substance Fraction 1,2 Dichloroethane (CAS 107-06-2) : 0.9997 ± 0.0004 (mol/mol) - Indicative Value Mass Fraction* 1,2-Dichloroethane :* 0.9998 ± 0.0002 (kg/kg) *indicative |
Remarks: Intended Use: CRM Certificate: NMIJ_CRM_4004a_en.pdf |
|||||
Producer: (click for contact & purchase details) This material is produced under a valid ISO 17034 accreditation | This material is linked to statutory activities as a national metrology institute (NMI) / a designated institute (DI) |
||||||
Public link to this factsheet: www.comar.bam.de/rm/302650 |
||||||
29 | NMIJ | NMIJ CRM 4038-a | 1,2-Dichloropropane | Pure organic material | 05-09-2023 | |
Properties:
Amount-of-Substance Fraction 1,2 Dichloropropane (CAS 78-87-5) : 0.999 ± 0.004 (mol/mol) - Indicative Value Mass Fraction* 1,2-Dichloropropane :* 0.999 ± 0.002 (kg/kg) *indicative |
Remarks: Intended Use: CRM Certificate: NMIJ_CRM_4038a_en.pdf |
|||||
Producer: (click for contact & purchase details) This material is produced under a valid ISO 17034 accreditation | This material is linked to statutory activities as a national metrology institute (NMI) / a designated institute (DI) |
||||||
Public link to this factsheet: www.comar.bam.de/rm/113750 |
||||||
30 | NMIJ | NMIJ CRM 4602-a | 1,4-Bis(trimethylsilyl) - 2,3,5,6 - tetrafluorobenzene for Quantitative NMR (1H, 19F) | Pure organic material (for quantitative NMR) | 05-09-2023 | |
Properties:
1,4-Bis(trimethylsilyl)-2,3,5,6-tetrafluorobenzene (CAS No. 16956-91-5) : 0.9998 ± 0.0003 (kg/kg) |
Remarks: Intended Use: CRM Certificate: NMIJ_CRM_4602a_en.pdf |
|||||
Producer: (click for contact & purchase details) This material is produced under a valid ISO 17034 accreditation | This material is linked to statutory activities as a national metrology institute (NMI) / a designated institute (DI) |
||||||
Public link to this factsheet: www.comar.bam.de/rm/495465 |